The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Apr. 19, 2023
Applicant:

Citex Holding Gmbh, Melle, DE;

Inventors:

Andrej Unruh, Bird in Hand, PA (US);

Jan H. Petermann, Melle, DE;

Assignee:

CiTEX Holding GmbH, Melle, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 48/92 (2019.01); B29C 48/00 (2019.01); B29K 507/04 (2006.01);
U.S. Cl.
CPC ...
B29C 48/92 (2019.02); B29C 48/022 (2019.02); B29C 2948/92152 (2019.02); B29C 2948/92247 (2019.02); B29C 2948/92447 (2019.02); B29C 2948/92723 (2019.02); B29C 2948/92828 (2019.02); B29K 2507/04 (2013.01);
Abstract

The present disclosure relates to a method and an extrusion line in which an additive content, in particular, a carbon black content, can be determined inline during extrusion of an extrusion product. For this purpose, an initial measurement is carried out in which a layer thickness and a refractive index of the extrusion product are determined, whereupon a continuous in-line measurement of the current additive content is carried out by a stationary radar measuring device. Thus, the layer thickness is set and the additive content is determined directly by the radar measuring device and controlled by setting the additive feed rate, in particular as a close-loop control.


Find Patent Forward Citations

Unruh, Andrej. (2026). Method for extruding an extrusion product and extrusion line (U.S. Patent No. 12629879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12629879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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