The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jun. 26, 2023
Applicant:

Tcl Zhonghuan Renewable Energy Technology Co., Ltd., Tianjin, CN;

Inventors:

Wei Zhao, Tianjin, CN;

Zhihui Liang, Tianjin, CN;

Xizhen Li, Tianjin, CN;

Yiqiang Gong, Tianjin, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/04 (2006.01);
U.S. Cl.
CPC ...
B24B 49/045 (2013.01);
Abstract

A device for automatically measuring a side length of a monocrystal after grinding may include a detection table, a first driver, a mechanical arm and a probe assembly, the detection table is used for placing the monocrystal to be detected, the measuring devices are symmetrically arranged on both sides of the detection table, one end of the first driver is connected to a side of the detection table, an column is disposed above another end of the first driver, and the first driver is capable of driving the column to move horizontally, the mechanical arm is arranged at a side of the column close to the detection table, and the probe assembly is arranged at one end of the mechanical arm away from the column.


Find Patent Forward Citations

Zhao, Wei. (2026). Device for automatically measuring side length of monocrystal after grinding (U.S. Patent No. 12629795). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12629795

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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