The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Aug. 27, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hiroshi Watanabe, Kanagawa, JP;

Shunsuke Nishimura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/04 (2006.01); A61B 6/50 (2024.01);
U.S. Cl.
CPC ...
A61B 6/502 (2013.01); A61B 6/0414 (2013.01); A61B 6/54 (2013.01);
Abstract

A mammography apparatus including: an imaging table that has a placement surface on which a breast is placed; a protective cover that includes a first magnetic object at a predetermined first position and is mounted on the placement surface; and a sample tray that includes a second magnetic object and a housing part of a sample and is placed on the placement surface via the protective cover, the second magnetic object being attracted to the first magnetic object by a magnetic force, wherein the sample tray is configured to be magnetically attached to the predetermined first position of the protective cover by the first magnetic object and the second magnetic object.


Find Patent Forward Citations

Watanabe, Hiroshi. (2026). Mammography apparatus and sample imaging assistance set (U.S. Patent No. 12629120). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12629120

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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