The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Aug. 31, 2021
Koninklijke Philips N.v., Eindhoven, NL;
Artur Sossin, Hamburg, DE;
Bernhard Johannes Brendel, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A method for material decomposition of an object based on spectral X-ray scan data for the object and based on application of a frequency split approach. The method comprises using two AI models in parallel to perform the material decomposition analysis based on input spectral X-ray data, wherein the models are configured such that one exhibits higher bias and lower variance (lower noise) than the other. The input spectral X-ray data is fed to both models. The output material composition data from the low bias model is low-pass filtered and the output material composition data from the low variance model is high pass filtered. The outputs from the two models are linearly combined, either before the filtering or after. The resulting combined material decomposition data has both lower bias and lower noise compared to the output generated if just one AI model were to be used.