The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 20, 2025
Applicant:

Biolinq Incorporated, San Diego, CA (US);

Inventors:

Alan Steven Campbell, San Diego, CA (US);

Robert Mckinlay, San Diego, CA (US);

Shuai Xu, San Diego, CA (US);

Anderson Micu;

Jacob Clary;

Assignee:

BIOLINQ INCORPORATED, SAN DIEGO, CA (US);

Primary Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...
A61B 5/14532 ; A61B 5/14546 ; A61B 5/1473 ; A61B 5/14514 ; A61B 5/1486 ; A61B 5/14865 ; A61B 5/150022 ; A61B 5/150984 ; A61B 5/685 ; A61B 2562/125 ;

Find Patent Forward Citations

Campbell, Alan. (2026). Method for improved sensor sensitivity of a microneedle-based continuous analyte monitoring system (U.S. Patent No. 12629060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12629060

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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