The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Apr. 13, 2023
Applicant:

Meta Platforms, Inc., Menlo Park, CA (US);

Inventors:

Ahmad Byagowi, Menlo Park, CA (US);

Pradip Sairam Pichumani, Fremont, CA (US);

Assignee:

Meta Platforms, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01R 31/28 (2006.01); H10P 74/00 (2026.01);
U.S. Cl.
CPC ...
H10P 74/27 (2026.01); G01R 31/2896 (2013.01);
Abstract

In some embodiments, an integrated circuit (IC) chip package, includes a die; and die level diagnostic cell circuitry embedded in the die at a die level diagnostic testing location, wherein the die level diagnostic cell circuitry located at the die level diagnostic testing location incorporates a die level diagnostic stimulus to test a diagnostic trace of the die without requiring a decapsulation of the integrated circuit chip package. In some embodiments, the die level diagnostic cell circuitry is utilized to capture at least one of an inductance associated with the die level diagnostic cell circuitry stimulus driven diagnostic trace, a capacitance associated with the die level diagnostic cell circuitry stimulus driven diagnostic trace, an impedance associated with the die level diagnostic cell circuitry stimulus driven diagnostic trace, and a resistance associated with the die level diagnostic cell circuitry stimulus driven diagnostic trace.


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