The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jun. 15, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hyungjun Kim, Suwon-si, KR;

Yong-Hee Cho, Suwon-si, KR;

Yongsung Kim, Suwon-si, KR;

Boeun Park, Hwaseong-si, KR;

Jeongil Bang, Suwon-si, KR;

Jooho Lee, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10D 1/68 (2025.01); C23C 14/08 (2006.01); C23C 14/34 (2006.01); C23C 16/06 (2006.01); C23C 16/455 (2006.01); C23C 28/00 (2006.01); H10B 12/00 (2023.01); H10F 77/30 (2025.01);
U.S. Cl.
CPC ...
H10D 1/684 (2025.01); C23C 14/088 (2013.01); C23C 14/3414 (2013.01); C23C 16/06 (2013.01); C23C 16/45527 (2013.01); C23C 28/32 (2013.01); C23C 28/3455 (2013.01); H10B 12/31 (2023.02); H10F 77/311 (2025.01);
Abstract

Disclosed are a high-dielectric and method of manufacturing the same, a target material used for manufacturing the high-dielectric, an electronic device including the high-dielectric, and an electronic apparatus including the electronic device. The high-dielectric includes a first material including oxygen and at least two components, and a second material different from the first materials. The first material is a dielectric having a dielectric constant greater than a dielectric constant of silicon oxide, and the second material is an element for reducing a crystallization temperature of the first material. The content of the second material with respect to the first material may be within a range that does not deteriorate leakage current characteristics of the first material. The content of the second material may be in a range of about 0.1 atomic % to about 10 atomic %, about 0.1 atomic % to about 8.5 atomic %, or about 0.1 atomic % to about 2 atomic %.


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