The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Aug. 07, 2023
Apple Inc., Cupertino, CA (US);
Qiming Li, Beijing, CN;
Xiang Chen, Campbell, CA (US);
Dawei Zhang, Saratoga, CA (US);
Yang Tang, San Jose, CA (US);
Jie Cui, San Jose, CA (US);
Rolando E Bettancourt Ortega, Munich, DE;
Manasa Raghavan, Sunnyvale, CA (US);
Yuexia Song, Beijing, CN;
Apple Inc., Cupertino, CA (US);
Abstract
The techniques described herein provide enhanced measurement gap sharing solutions that enable measurement gap sharing for layer 1 (L1) measurements for serving and non-serving cells, and for layer 3 (L3) measurements for intra-frequency measurements and inter-frequency/inter-radio access technology (RAT) measurements. Also provided are solutions for measurement gap sharing among intra-frequency L1 and L3 measurements and inter-frequency L1 and L3 measurements. Measurement gap patterns for L1 and L3 measurements are also provided, as well as solutions for further splitting L1 measurement gap sharing among different types of L1 operations.