The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Mar. 16, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Pravjyot Singh Deogun, Bangalore, IN;

Ozcan Ozturk, San Diego, CA (US);

Jing Sun, San Diego, CA (US);

Xiaoxia Zhang, San Diego, CA (US);

Kapil Bhattad, Bangalore, IN;

Ananta Narayanan Thyagarajan, Bangalore, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04B 7/06 (2006.01); H04B 17/318 (2015.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04B 7/06952 (2023.05); H04B 17/318 (2015.01); H04W 56/0005 (2013.01);
Abstract

Aspects described herein relate to receiving multiple synchronization signal blocks (SSBs) from a target cell over a measurement time window. A repeating beam index for one or more of the multiple SSBs can be identified based at least in part on a determination of a repeat parameter indicating a number of beams in a SSB pattern for the target cell. A beam set of the one or more of the multiple SSBs determined to have the same repeating beam index can be associated. One or more parameters of the one or more of the multiple SSBs of the beam set can be measured and reported.


Find Patent Forward Citations

Loading…