The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

May. 14, 2024
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventor:

Ji Wook Jeong, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/74 (2022.01); G01N 23/203 (2006.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); G06V 10/143 (2022.01); G06V 10/30 (2022.01); G06V 20/50 (2022.01);
U.S. Cl.
CPC ...
G06V 10/761 (2022.01); G01N 23/203 (2013.01); G06T 7/70 (2017.01); G06T 7/90 (2017.01); G06V 10/143 (2022.01); G06V 10/30 (2022.01); G06V 20/50 (2022.01); G01N 2223/401 (2013.01); G01N 2223/639 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10116 (2013.01);
Abstract

Proposed is an apparatus and method for identifying and displaying material types using multi-energy X-ray backscattering. Specifically, the method for identifying cargo includes a process of installing a phantom having a preset location and material, a process of performing photographing under a condition of orthogonal incidence on another side of the predefined container walls, a process of normalizing an entire image, a process of generating a difference image from the normalized multi-energy backscattering image, a process of inferring a similarity with a target material, a process of detecting a location and type of the target material in the entire image, and a process of transmitting information on the location and type of the target material to a display.


Find Patent Forward Citations

Jeong, Ji. (2026). Apparatus and method for identifying and displaying material types using multi-energy x-ray backscattering (U.S. Patent No. 12626484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12626484

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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