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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12626475 B1

PDFFull Text
Date of Patent:
May. 12, 2026

Filed:

Jun. 14, 2021

Sample observation device and sample observation method

Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Satoshi Yamamoto, Hamamatsu, JP;

Masanori Matsubara, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:

Faegre Drinker Biddle & Reath LLP

Primary Examiner:

Matthew C Bella

Assistant Examiner:

Andrew B. Jones

Int. Cl.
CPC ...
G06V 10/143 (2022.01); G06T 7/70 (2017.01); G06V 10/28 (2022.01); G06V 10/60 (2022.01);
U.S. Cl.
CPC ...
G06V 10/143 (2022.01); G06T 7/70 (2017.01); G06V 10/28 (2022.01); G06V 10/60 (2022.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01);
Abstract

In a sample observation device, an image acquisition unitacquires a plurality of pieces of image data of a sample in a Y-axis direction, and an image generation unit generates luminance image data on luminance of the sample on the basis of the plurality of pieces of image data, binarizes luminance values of each of the plurality of pieces of image data to generate a plurality of pieces of binarized image data, and generates area image data on an existing area of the sample on the basis of the plurality of pieces of binarized image data.

Find Patent Forward Citations

Yamamoto, Satoshi. (2026). Sample observation device and sample observation method (U.S. Patent No. 12626475). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12626475

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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