The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Apr. 15, 2022
Applicant:

Advanced Cell Diagnostics, Inc., Newark, CA (US);

Inventors:

Ching-Wei Chang, Newark, CA (US);

Xiao-Jun MA, Newark, CA (US);

Han Lu, Newark, CA (US);

Bing-Qing Zhang, Newark, CA (US);

Hayeun Ji, Newark, CA (US);

Ming Yu, Newark, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/194 (2017.01); G06T 7/00 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/174 (2017.01); G06T 7/194 (2017.01);
Abstract

The present disclosure provides materials and methods related to image processing. In particular, the present disclosure provides methods for enhancing target signal detection using imaging processing analysis that identifies and removes non-specific background signals. The image processing methods of the present disclosure are useful for enhancing target signals in a variety of assays that involve fluorescent detection (e.g., fluorescent in situ hybridization, immunofluorescence).


Find Patent Forward Citations

Chang, Ching-Wei. (2026). Materials and methods related to image processing (U.S. Patent No. 12626364). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12626364

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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