The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Oct. 08, 2021
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Kai Walter, Schriesheim, DE;

Constantin Kappel, Schriesheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 2207/10016 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20182 (2013.01);
Abstract

A method for improving signal-to-noise of image frames is provided. The method includes estimating a representative velocity of an optical flow in an image frame sequence. The method also includes determining an interpolation factor from the representative velocity of the optical flow. The method also includes employing a trained artificial neural network for generating an expanded image frame sequence. The expanded image frame sequence includes a number of interpolating image frames. Each interpolating image frame interpolates between subsequent image frames of the image frame sequence. The number of interpolating image frames corresponds to the interpolation factor. The method also includes computing a time-dependent combination of image frames from the expanded image frame sequence to generate an output image frame sequence.


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