The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Feb. 10, 2021
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Fan Feng, New York, NY (US);

Allison Fenichel, Brooklyn, NY (US);

Illiana Reed, San Francisco, CA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

In some implementations, a system may define common attributes of a first dataset and a second dataset. The system may generate a candidate set of mappings between one or more entities in the first dataset and one or more entities in the second dataset based on candidate generation criteria associated with a related pair of common attributes. The system may generate feature sets for the candidate set of mappings based on the common attributes and a featurization configuration. The system may train a machine learning model for performing entity resolution between the first dataset and the second dataset. The system may perform entity resolution between the first dataset and the second dataset based on the feature sets for the candidate set of mappings using the trained machine learning model.


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