The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Sep. 13, 2021
Applicant:

Palo Alto Networks, Inc., Santa Clara, CA (US);

Inventors:

Zhen Han Si, Milpitas, CA (US);

Claudionor Jose Nunes Coelho, Jr., Redwood City, CA (US);

Viswesh Ananthakrishnan, Palo Alto, CA (US);

Eyal Firstenberg, Palo Alto, CA (US);

Assignee:

Palo Alto Networks, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/084 (2023.01); H04L 41/16 (2022.01); H04L 43/04 (2022.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); H04L 41/16 (2013.01); H04L 43/04 (2013.01);
Abstract

Identifying causal relationships between outlier telemetry events in telemetry metric data using machine learning ensembles of an autoencoder and an attention mechanism provides an automated framework for root cause analysis. Outlier telemetry events are detected across a cloud of telemetry events using unsupervised learning models. To establish a causal relationship between outlier telemetry events, autoencoder/attention mechanism ensembles are trained for pairs of telemetry metrics. When inputs of sequences of telemetry events of a first telemetry metric and a second telemetry metric to the ensemble have sufficiently high loss value, a causal relationship is inferred. Internal node values of the attention mechanism from the input identify specific time stamps for the first telemetry metric that have a causal relationship with the outlier telemetry event.


Find Patent Forward Citations

Quick Actions:

Si, Zhen. (2026). Causality detection for outlier events in telemetry metric data (U.S. Patent No. 12626138). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12626138

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