The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Aug. 02, 2023
Autocrypt Co., Ltd., Seoul, KR;
Duk Soo Kim, Seoul, KR;
Eui Seok Kim, Seoul, KR;
Sang Gyoo Sim, Seoul, KR;
Ki Ho Joo, Seoul, KR;
Jung Won Lee, Seongnam-si, KR;
Jong Guk Lee, Suwon-si, KR;
Jung Wook Kim, Seoul, KR;
Sang Seok Lee, Seoul, KR;
Seung Young Park, Chuncheon-si, KR;
Autocrypt Co., Ltd., Seoul, KR;
Abstract
Disclosed is a method and apparatus for detecting anomalies in a system log on the basis of self-supervised learning, using a language model. The method comprises performing preprocessing on the system log, generating a normal token sequence having a preset length by concatenating tokenized log lines of the system log, generating an abnormal token sequence using the normal token sequence, calculating an anomaly score for a determination target token sequence using a sentence classification model, and determining the token sequence as an abnormal system log when the calculated anomaly score is greater than a threshold value.