The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Apr. 19, 2022
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Yuhei Umeda, Kawasaki, JP;

Takashi Katoh, Kawasaki, JP;

Yuichi Ike, Kawasaki, JP;

Mari Kajitani, Fukuoka, JP;

Masatoshi Takenouchi, Hadano, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/35 (2025.01); G06F 18/21 (2023.01); G06F 18/2321 (2023.01); G06F 18/2411 (2023.01); G06F 18/2431 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 18/2321 (2023.01); G06F 16/285 (2019.01); G06F 16/35 (2019.01); G06F 18/217 (2023.01); G06F 18/2411 (2023.01); G06F 18/2431 (2023.01); G06N 20/00 (2019.01);
Abstract

A non-transitory computer-readable storage medium storing an estimation program that causes a computer to execute a process includes specifying representative points of each of training clusters that corresponds to each of labels targeted for estimation; setting boundaries between each of input clusters under a condition that a number of the input clusters and a number of the representative points coincide with each other, the input clusters being generated by clustering in a feature space for input data; acquiring estimation results for the labels with respect to the input data based on a correspondence relationship between the input clusters and the training clusters based on the boundaries; and estimating determination accuracy for the labels by using the machine learning model with respect to the input data based on the estimation results.


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