The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
May. 09, 2024
Snowflake Inc., Bozeman, MT (US);
Matthew J. Glickman, Larchmont, NY (US);
Orestis Kostakis, Redmond, WA (US);
Justin Langseth, Kailua, HI (US);
Snowflake Inc., Bozeman, MT (US);
Abstract
An advanced system for refining overlap queries in a database system based on user feedback. The system monitors interactions of a first user with a first dataset on the database system, where the first dataset is associated with the first user. Feedback regarding the quality of a results dataset, generated from an executed overlap query, is received from the first user. This feedback informs the generation of a similarity score dataset that enhances the creation of new overlap queries. These new overlap queries are designed to output refined overlap datasets between the first dataset and a second dataset associated with a second user. A new joined dataset is generated by executing these overlap queries, comprising data from both the first and second datasets. A new results dataset is generated, providing the first user with refined recommendations based on additional feedback.