The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Dec. 03, 2024
International Business Machines Corporation, Armonk, NY (US);
Ali Y. Duale, Poughkeepsie, NY (US);
Patrick Duffy, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing artificial intelligence units (AIUs) located across separate processing chips is disclosed. The method provides the right test environment and test cases that stress remote AIU usages. The test cases include multiple machine instruction streams built to be executed on AIUs located on different processing chips. These test instruction streams include AIU primitives that may be executed on local or remote AIUs. The insertion of AIU primitives in each instruction stream is based on a random selection. This randomness allows concentration of AIU primitives in instruction streams built for processor cores of one processing chip while instruction streams running on another processing chip may lack AIU primitives, and as a result, the AIU on that processing chip may become idle. The test cases also cause different AIUs on different processing chips to compete for resources such as input and output data buffers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile