The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

May. 11, 2023
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Masakazu Shirai, Kanagawa, JP;

Yu Saito, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 21/20 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5041 (2013.01); G03G 21/206 (2013.01);
Abstract

An image inspection device includes: an illumination part extending in a width direction of a medium, which intersects a medium transport direction, so as to face a medium transport path, and configured to radiate light on an image formed on a surface of the medium; a reading part configured to read reflected light from the image as image inspection information; and a cooling part configured to cool an entire area of the illumination part in the width direction of the medium. The cooling part includes one blowing part provided on one side in the width direction of the medium and configured to suck and blow outside air, a first guide extending in the width direction of the medium and configured to guide the air blown from the blowing part to a flow path extending in the width direction of the medium, and a second guide configured to guide the air, guided by the first guide, in the medium transport direction to a space where the illumination part is disposed, and distribute the air such that an air volume is uniform over the entire area of the illumination part in the width direction of the medium.


Find Patent Forward Citations

Shirai, Masakazu. (2026). Image inspection device and image forming apparatus using the same (U.S. Patent No. 12625449). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12625449

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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