The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jan. 27, 2022
Applicant:

View, Inc., Milpitas, CA (US);

Inventors:

Aditya Dayal, Sunnyvale, CA (US);

Nitesh Trikha, Pleasanton, CA (US);

Assignee:

View Operating Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/163 (2006.01); E06B 9/24 (2006.01); G05B 19/042 (2006.01); H02J 50/20 (2016.01); H02J 50/80 (2016.01);
U.S. Cl.
CPC ...
G02F 1/163 (2013.01); E06B 9/24 (2013.01); G05B 19/042 (2013.01); H02J 50/20 (2016.02); H02J 50/80 (2016.02); E06B 2009/2417 (2013.01); E06B 2009/2464 (2013.01); G05B 2219/25011 (2013.01); G05B 2219/25252 (2013.01); G05B 2219/2614 (2013.01); G05B 2219/2628 (2013.01);
Abstract

Disclosed herein are methods, apparatuses, non-transitory computer readable media, and systems for performing synergistic sensing an attribute of an environment of a facility. Sensing may be performed by sensors of a facility from which a first sensor measures a first attribute at its first sampling rate. Due to a correlation of the first sensor and a second sensor that measures a second attribute at a second sampling rate slower than the first sampling rate, the second attribute can be determined and/or predicted at least in part by using measurements of the first attribute by the first sensor.


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