The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Dec. 13, 2022
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Kai Ritschel, Wetzlar, DE;
Oliver Schlicker, Wetzlar, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01N 21/6458 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01);
Abstract
A fluorescence microscope system including an optical detection system configured to capture a raw image of a sample, the raw image including a plurality of pixels, each pixel having a brightness value and a processor, configured to determine one or more invalid pixels in the raw image, assign a predetermined value to each invalid pixel, determine a range of brightness values including the brightness values of a majority of the plurality of pixels excluding the one or more invalid pixels, and generate a processed image of the sample based on the determined range of brightness values.