The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Dec. 23, 2019
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Werner Knebel, Kronau, DE;

Florian Fahrbach, Mannheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0036 (2013.01); G02B 21/0028 (2013.01); G02B 21/0032 (2013.01); G02B 21/008 (2013.01); G02B 21/06 (2013.01);
Abstract

A microscope, which is a confocal microscope converted into a light sheet microscope, includes a microscope body and a mechanical receiving apparatus for microscope objectives, through which a microscope beam path extends. An optical module attachable to the receiving apparatus is configured to illuminate a sample volume and collect and transmit light from the sample volume. The optical module comprises: first and second optical arrangements with first and second beam paths that intersect in the sample volume, an optical beam path selector configured to combine the first and/or second beam path with the microscope beam path, and an attachment element arranged between the first or second optical arrangement and the sample volume, wherein the first or second beam path extend at least in sections through the attachment element in order to generate a light sheet. An area sensor is configured to detect light collected from the sample volume.


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