The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

May. 13, 2021
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Johannes Buback, Sersheim, DE;

Martin Ossig, Tamm, DE;

Igor Sapina, Kornwestheim, DE;

Assignee:

FARO Technologies, Inc., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/481 (2006.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G01S 17/894 (2020.01); G01S 7/4816 (2013.01); G01S 7/4817 (2013.01); G06T 7/50 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30241 (2013.01);
Abstract

An example method includes moving a base unit through an environment, the base unit comprising the first scanner and the second scanner. The method further includes capturing, by the first scanner, a first scan of the environment, the first scan comprising at least one first scanline. The method further includes capturing, by the second scanner, a second scan of the environment, the second scan comprising at least one second scanline, wherein the second scanner scans about a first axis at a first speed and scans about a second axis at a second speed. The method further includes determining, by a processing system, an intersection at an object surface between one of the at least one first scanline and one of the at least one second scanline. The method further includes aligning, by the processing system, the first scan and the second scan based at least in part on the intersection.


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