The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jul. 07, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seong-Hwan Hyun, Seoul, KR;

Seong-Cheol Kim, Seoul, KR;

Jihye Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/87 (2006.01); G01S 13/06 (2006.01); G01S 13/46 (2006.01); G01S 13/58 (2006.01); G01S 13/92 (2006.01);
U.S. Cl.
CPC ...
G01S 13/87 (2013.01); G01S 13/06 (2013.01); G01S 13/582 (2013.01); G01S 13/584 (2013.01); G01S 13/878 (2013.01); G01S 13/92 (2013.01); G01S 2013/468 (2013.01);
Abstract

An operating method of a server for calculating a position of a measurement target includes receiving first measurement information including a result of measuring the measurement target by a first electronic device, receiving second measurement information including a result of measuring the measurement target by a second electronic device, and calculating the position of the measurement target based on the first measurement information and the second measurement information.


Find Patent Forward Citations

Hyun, Seong-Hwan. (2026). Calculating the position of a measurement target using multiple measuring devices (U.S. Patent No. 12625252). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12625252

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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