The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Oct. 20, 2022
Universite DE Rennes, Rennes, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Institut National Des Sciences Appliquees DE Rennes, Rennes, FR;
Nantes Université, Nantes, FR;
Centralesupelec, Gif-sur-Yvette, FR;
UNIVERSITÉ DE RENNES, Rennes, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
INSTITUT NATIONAL DES SCIENCES APPLIQUÉES DE RENNES, Nantes, FR;
CENTRALESUPÉLEC, Gif-sur-Yvette, FR;
Abstract
A device for measuring a physical quantity related to an electromagnetic field emitted by an electromagnetic source. The device is configured to simulate the electromagnetic characteristics of a reference object made of a lossy medium, e.g. a biological tissue. The device includes: a dielectric layer including an upper surface faced to the electromagnetic source and a bottom surface, the dielectric layer being at least partly transparent to the electromagnetic field emitted by the electromagnetic source; an electromagnetic field enhancing element arranged relative to the dielectric layer and configured in a manner to enhance the intensity of the electromagnetic field transmitted through the dielectric layer in a pre-determined zone; and a sensor arranged beneath the electromagnetic field enhancing element and configured to measure the physical quantity related to the electromagnetic field transmitted through the dielectric layer and the electromagnetic field enhancing element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile