The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Feb. 20, 2023
Applicant:

The Boeing Company, Arlington, VA (US);

Inventors:

Samuel R. Goertz, Issaquah, WA (US);

Barry A. Fetzer, Renton, WA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/06 (2006.01); G01N 29/11 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/0609 (2013.01); G01N 29/11 (2013.01); G01N 29/44 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/0289 (2013.01);
Abstract

A method for associating test data for a part under test with an end item coordinate system includes acquiring scan data during a plurality of scans of at least a portion of the part of an end item along a predetermined path plan using an ultrasonic scanning device of a robot. Robot location information associated with the scan data acquired during the plurality of scans is recorded. The robot location information is based on a robot coordinate system. The robot location information is translated to end item location information within the end item coordinate system based on at least three common reference points in the predetermined path plan, an electronic design model of the end item within the end item coordinate system, and the part. A non-destructive inspection (NDI) system for associating the test data with the end item coordinate system is also provided.


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