The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Mar. 17, 2022
Applicants:
Jeol Ltd., Tokyo, JP;
Tohoku University, Sendai, JP;
Inventors:
Assignees:
JOEL Ltd., Tokyo, JP;
TOHOKU UNIVERSITY, Sendai, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/2252 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); G01N 2223/079 (2013.01); G01N 2223/40 (2013.01);
Abstract
A soft X-ray measurement device detects a characteristic X-ray emitted from a sample including a primary element and a secondary element. An X-ray spectrum generated by a spectrum generator includes a waveform of interest which is an intrinsic waveform of the primary element, caused by transition of electrons from a valence band to an inner shell in the primary element. A secondary element analyzer calculates quantitative information of the secondary element through analysis of the waveform of interest.