The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Apr. 11, 2024
Applicant:
Viken Detection Corporation, Burlington, MA (US);
Inventors:
James P. Ryan, Bedford, MA (US);
John P. O'connor, Andover, MA (US);
Assignee:
Viken Detection Corporation, Burlington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/20008 (2018.01); G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 23/203 (2013.01); G01N 2223/20 (2013.01); G01N 2223/33 (2013.01); G01N 2223/50 (2013.01);
Abstract
An X-ray scanning system includes: an X-ray source configured to irradiate a target with source X-rays in the course of relative motion between the X-ray source and the target; a feature sensor configured to sense a feature of the target in the course of the relative motion; and a communication interface operatively coupled to the feature sensor and configured to output a blanking signal responsive to the feature sensor sensing the feature of the target.