The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Aug. 24, 2022
Applicant:

Siemens Shanghai Medical Equipment Ltd., Shanghai, CN;

Inventors:

Guo Qing Zhang, Shanghai, CN;

Yang Wang, Shanghai, CN;

Wen Hao Chen, Shanghai, CN;

Tao Tao Li, Shanghai, CN;

Yi Tian, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); A61B 6/58 (2024.01); A61B 6/03 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/06 (2013.01); A61B 6/583 (2013.01);
Abstract

A correction method for a scatter signal caused by a wedge filter includes: S: performing an air scan by using CT equipment, and calculating a relative intensity Wof a scatter signal caused by a wedge filter in the air scan according to an air scan result, S: performing an object scan on a plurality of experimental objects by using the CT equipment, and calculating theoretical scatter signal intensities Wof the experimental objects in the object scan in combination with the result of S, S: fitting Wof the experimental objects in the object scan and scatter signal intensity estimations Wof the experimental objects in the object scan, and S: correcting the scan results according to a difference between a scatter signal intensity estimation Wof an actual object in the object scan and a theoretical scatter signal intensity Wof the actual object in the object scan.


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