The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Sep. 28, 2021
Applicant:
Daikin Industries, Ltd., Osaka, JP;
Inventors:
Assignee:
DAIKIN INDUSTRIES, LTD., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); B29C 45/00 (2006.01); B29C 45/76 (2006.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); B29C 45/0001 (2013.01); B29C 45/76 (2013.01); B29C 45/768 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/95 (2013.01); B29C 2945/7629 (2013.01); B29C 2945/76461 (2013.01); G01N 2021/8854 (2013.01);
Abstract
A method for inspecting a molded article, the method enabling non-destructive inspection of an internal condition of a molded article containing fluorine, and a method for producing a molded article including the inspection method. The method for inspecting a molded article includes a step (A1) of inspecting an internal condition of a molded article having a fluorine content of 30% by mass or more based on image data obtained by imaging the molded article by optical coherence tomography.