The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Sep. 25, 2023
Applicant:
Espec Corp., Osaka, JP;
Inventors:
Hiroyuki Enoki, Osaka, JP;
Haruki Seto, Osaka, JP;
Assignee:
ESPEC CORP., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01); G01N 33/18 (2006.01); G01W 1/00 (2006.01); F25C 3/04 (2006.01);
U.S. Cl.
CPC ...
G01N 17/00 (2013.01); G01N 17/002 (2013.01); G01W 1/00 (2013.01); F25C 3/04 (2013.01); G01N 33/1873 (2024.05);
Abstract
In a snow accretion test method, a snow accumulation step of accumulating snow on a specimen, and a snow accretion step of freezing snow accumulated on the specimen in a state where snow is not supplied to the specimen are performed. The snow accumulation step and the snow accretion step are repeatedly performed. In the snow accretion step, the ambient temperature of the specimen is adjusted to a temperature lower than the ambient temperature in the snow accumulation step.