The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Mar. 03, 2021
Applicant:

Rion Co., Ltd., Tokyo, JP;

Inventors:

Kazuna Bando, Tokyo, JP;

Kaoru Kondo, Tokyo, JP;

Takuya Tabuchi, Tokyo, JP;

Sota Kondo, Tokyo, JP;

Assignee:

RION CO., LTD., Kokubunji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/0227 (2024.01); G01N 15/0205 (2024.01); G01N 15/10 (2024.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 15/0211 (2013.01); G01N 2015/025 (2013.01);
Abstract

A flow passage is irradiated with irradiation light, and light scattered from a particle contained in a sample passing through a detection region that is formed in a prescribed section is condensed at a position obtained by extending the prescribed section in a flow direction of the sample and captured at a prescribed frame rate. Then movement amount of the particle due to Brownian motion in directions perpendicular to the flow direction on the basis of captured plural frame images. Furthermore, a particle size of the particle is determined by correcting the movement amount using correction values that were obtained in advance corresponding to each of defocus positions for correcting errors of movement amount in the images caused by magnification.


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