The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jul. 29, 2021
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Yuichi Matsuki, Tokyo, JP;

Toyohisa Shinmiya, Tokyo, JP;

Kinya Nakagawa, Tokyo, JP;

Yuji Yamasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01);
U.S. Cl.
CPC ...
G01N 3/20 (2013.01); G01N 2203/0064 (2013.01); G01N 2203/0067 (2013.01); G01N 2203/0236 (2013.01); G01N 2203/0282 (2013.01);
Abstract

To further enhance the evaluation accuracy of a delayed fracture. Focusing on the fact that a calculated stress value serving as the reference for the occurrence of the delayed fracture changes depending on analysis conditions of a forming analysis, a value obtained by changing a stress value serving as the reference for the occurrence of the delayed fracture according to the analysis conditions for analyzing an intended formed article (article for practical use) is used as the reference for evaluating the delayed fracture. For example, analysis conditions of a forming analysis in an evaluation test of the delayed fracture are matched with analysis conditions of a forming analysis of an article for practical use represented by an actual automobile component.


Find Patent Forward Citations

Matsuki, Yuichi. (2026). Delayed fracture characteristic evaluation method and program (U.S. Patent No. 12625043). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12625043

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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