The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Jun. 22, 2023
Espec Corp., Osaka, JP;
Haruki Seto, Osaka, JP;
Yuta Moriyama, Osaka, JP;
Katsuhiko Watabe, Osaka, JP;
Tetsuya Okadome, Osaka, JP;
Masaki Yamamoto, Osaka, JP;
Takumi Usui, Osaka, JP;
ESPEC CORP., Osaka, JP;
Abstract
There is provided an environmental test apparatus that can create a predetermined environment inside a test chamber, the environmental test apparatus including: the test chamber for placing a test target object; a heating portion; and a cooling portion. The cooling portion has a refrigeration circuit having a compressor, a condenser, an expansion portion, and an evaporator and in which a phase-changing refrigerant is to be circulated. The refrigeration circuit has a first bypass flow path connecting a discharge side of the condenser and a suction side of the compressor and the first bypass flow path is provided with a first flow rate control portion. A temperature measurement portion for measuring a temperature of the compressor and a controller are provided. The controller is configured to control a substantial degree of opening of the first flow rate control portion according to a detection value of the temperature measurement portion.