The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jan. 30, 2024
Applicant:

Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);

Inventor:

Darren Schipper, Ann Arbor, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/12 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 3/12 (2013.01); G01J 3/0297 (2013.01); G01J 3/28 (2013.01); G01N 21/278 (2013.01); G01J 2003/1213 (2013.01);
Abstract

A calibration light source includes: a broad band light source emitting light in a broad spectral range; and a filter receiving light emitted by the broad band light source and providing structured light by imposing an attenuation pattern exhibiting pattern features at multiple spectral reference lines on the received light such that an emission spectrum of the structured light emitted by the calibration light source exhibits distinct, identifiable emission spectrum features corresponding to the pattern features at the multiple spectral reference lines. A method of calibrating at least one spectrometer using the calibration light source is further disclosed.


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