The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jun. 16, 2020
Applicant:

Primes Gmbh Messtechnik Für Die Produktion Mit Laserstrahlung, Pfungstadt, DE;

Inventors:

Reinhard Kramer, Pfungstadt, DE;

Otto Märten, Dreieich, DE;

Stefan Wolf, Groß-Gerau, DE;

Johannes Roßnagel, Mainz-Kastel, DE;

Roman Niedrig, Berlin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/70 (2014.01); B23K 26/046 (2014.01); B23K 26/064 (2014.01); B23K 26/073 (2006.01); G01J 1/04 (2006.01); G01J 1/42 (2006.01); G02B 7/02 (2021.01); G02B 7/28 (2021.01);
U.S. Cl.
CPC ...
G01J 1/4257 (2013.01); B23K 26/046 (2013.01); B23K 26/0648 (2013.01); B23K 26/073 (2013.01); B23K 26/705 (2015.10); G01J 1/0411 (2013.01); G02B 7/02 (2013.01); G02B 7/28 (2013.01);
Abstract

The present disclosure relates to a beam analysis device for determining a light beam state, e.g., determining the focal position of a light beam, where the device has a partial beam imaging device having at least one first selection device for forming a first partial beam from a first partial aperture region of the first measurement beam, and an imaging device for imaging the first partial beam for generating a first beam spot onto a detector unit having a spatially-resolving detector. The beam analysis device also can have an evaluation unit for processing the signals of the detector unit, for determining a lateral position (a) of the first beam spot, and for determining changes in the lateral position (a, a') of the first beam spot over time. An optical system for focal position control with a laser optics and with a beam analysis device. Additionally, the disclosure relates to a corresponding beam analysis method and methods for focal position control of a laser optics and for focal position tracking of a laser optics.


Find Patent Forward Citations

Kramer, Reinhard. (2026). System and method for focal position control (U.S. Patent No. 12624990). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12624990

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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