The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Aug. 24, 2021
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Masaaki Shimatani, Tokyo, JP;

Shimpei Ogawa, Tokyo, JP;

Shoichiro Fukushima, Tokyo, JP;

Satoshi Okuda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/02 (2006.01); G01R 31/12 (2020.01); H10F 77/16 (2025.01);
U.S. Cl.
CPC ...
G01J 1/0295 (2013.01); G01R 31/129 (2013.01); H10F 77/16 (2025.01);
Abstract

An electromagnetic wave detector includes a semiconductor layer, a two-dimensional material layer, a first electrode portion, a second electrode portion, and a ferroelectric layer. Two-dimensional material layer is electrically connected to semiconductor layer. First electrode portion is electrically connected to two-dimensional material layer. Second electrode portion is electrically connected to two-dimensional material layer with semiconductor layer interposed therebetween. Ferroelectric layer is electrically connected to at least any one of first electrode portion, second electrode portion and semiconductor layer. Electromagnetic wave detector is configured such that an electric field generated from ferroelectric layer is shielded with respect to two-dimensional material layer. Alternatively, ferroelectric layer is arranged so as not to be overlapped with two-dimensional material layer in plan view.


Find Patent Forward Citations

Shimatani, Masaaki. (2026). Electromagnetic wave detector and electromagnetic wave detector array (U.S. Patent No. 12624988). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12624988

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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