The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Dec. 15, 2023
Applicant:

Sintela Limited, Lodway, GB;

Inventor:

Stuart J. Russell, Lodway, GB;

Assignee:

Sintela Limited, Lodway, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35354 (2013.01);
Abstract

An optical measurement system in which a coherent light source generates a light signal, and a launch stage receives the light signal from the light source and generates a test signal. The test signal is launched along an optical path. The launch stage includes a first IQ modulator for controlling the test signal. The optical measurement system further includes a local oscillator stage configured to generate a local oscillator signal, wherein local oscillator stage has a second IQ modulator for controlling the local oscillator signal. A detector stage of the system is configured to receive the local oscillator signal from the local oscillator stage and a scattered signal from the optical path, and interfere the local oscillator signal with the scattered signal. The optical measurement system is implemented with one or more photonic integrated circuits.


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