The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
May. 11, 2023
Korea Institute of Machinery & Materials, Daejeon, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Dongwoo Kang, Daejeon, KR;
Hong Ki Yoo, Daejeon, KR;
Jin Su Choi, Daejeon, KR;
Hyunchang Kim, Sejong, KR;
Seung-Hyun Lee, Daejeon, KR;
Kyung-Rok Kim, Daejeon, KR;
Jaeyoung Kim, Daejeon, KR;
KOREA INSTITUTE OF MACHINERY & MATERIALS, Daejeon, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon, KR;
Abstract
In a roller gap measurement system and a roller gap measurement method using the roller gap measurement system, the roller gap measurement system includes a light source, a refractive part, a sensor part and an image processing part. The light source is configured to provide an incident light toward the gap between first and second rollers. The refractive part is configured to receive a complex light passing through the gap between the first and second rollers, and configured to refract the complex light. The sensor part is configured to receive the refracted light and configured to image a complex pattern. The image processing part is configured to obtain a gap information between the first and second rollers, based on the imaged complex pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile