The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jan. 14, 2021
Applicant:

The Regents of the University of Colorado, a Body Corporate, Denver, CO (US);

Inventors:

Robert R. Mcleod, Boulder, CO (US);

Asais Camila Uzcategui, Denver, CO (US);

John Elliott Hergert, Denver, CO (US);

Archish Muralidharan, Denver, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/124 (2017.01); B29C 64/264 (2017.01); B29K 23/00 (2006.01); B29K 105/00 (2006.01); B29K 105/24 (2006.01); B33Y 50/02 (2015.01); B33Y 70/00 (2020.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/124 (2017.08); B29C 64/264 (2017.08); B33Y 50/02 (2014.12); B33Y 70/00 (2014.12); B29K 2023/0691 (2013.01); B29K 2105/0002 (2013.01); B29K 2105/24 (2013.01); B29K 2995/0094 (2013.01);
Abstract

Stereolithography with micron scale control of properties is described herein. In one aspect, a computer-implemented method for 3-D printing of a material can include generating a functional relation predicting one or more physical properties of the material resulting from printing parameters; algebraically or numerically solving the functional relation to generate a second functional relation predicting expected printing parameters resulting in the one or more physical properties; and printing the material via a photopolymerization printer according to the set of printing parameters determined by the second functional relation.


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