The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Dec. 08, 2020
Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Kei Kuwabara, Tokyo, JP;

Kenichi Matsunaga, Tokyo, JP;

Takayuki Ogasawara, Tokyo, JP;

Assignee:

NTT, INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/301 (2021.01); A61B 5/346 (2021.01);
U.S. Cl.
CPC ...
A61B 5/6802 (2013.01); A61B 5/0022 (2013.01); A61B 5/301 (2021.01); A61B 5/346 (2021.01); A61B 2560/0242 (2013.01);
Abstract

A measurement system includes a measurement unit configured to perform measurement a plurality of times on the basis of a first clock signal having a first clock period to obtain a plurality of measurement results, a time stamp provision unit configured to provide a time stamp indicating a measurement time to each measurement result obtained in the second period among the plurality of measurement results obtained using the measurement unit the basis of a second clock signal having a second clock period longer than the first clock period and having better period accuracy than the first clock signal, and a measurement time correction unit configured to correct a measurement time of a measurement result in accordance with a period specified using two time stamps and the number of measurement results obtained during the period.


Find Patent Forward Citations

Kuwabara, Kei. (2026). Measurement system, measurement method, measurement device, and program (U.S. Patent No. 12622639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12622639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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