The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Mar. 17, 2023
Eclypia, Grenoble, FR;
ECLYPIA, Grenoble, FR;
Abstract
Method for measuring a parameter of interest in a target environment () by means of a non-invasive sensor () based on photoacoustic detection or photothermal detection, comprises: a) a sensor that comprises an adaptation module () is provided comprising a processor that implements an inverse modelling algorithm; b) the adaptation module chooses an initial model irradiation configuration; c) it determines, in a correspondence table, the optimal irradiation case; d) a light source irradiates the target environment according to the optimal irradiation case; e) a detection cell detects a signal; f) the processor of the adaptation module returns a current model configuration (CMmes) and an estimated value for the parameter of interest (Pest); g) the processor of the adaptation module evaluates the chosen model irradiation configuration, and only if this irradiation model configuration differs from the current model configuration; g1) it receives the current model configuration (CMmes).