The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

May. 13, 2021
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Hitoshi Shimizu, Tokyo, JP;

Kazuhiro Omori, Tokyo, JP;

Hisashi Tsukada, Hachioji, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/135 (2006.01); A61B 3/117 (2006.01);
U.S. Cl.
CPC ...
A61B 3/135 (2013.01); A61B 3/117 (2013.01);
Abstract

A slit lamp microscope according to an embodiment example includes a scanner, a first assessing processor, and a controller. The scanner is configured to perform application of a scan to an anterior segment of a subject's eye with slit light to collect an image group. The first assessing processor is configured to execute an assessment of a quality of the image group collected by the scanner. The controller is configured to selectively execute at least two control modes according to a result of the assessment of the quality obtained by the first assessing processor.


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