The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

May. 08, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Omar Gad, London, GB;

Yasmin Eldokany, New Cairo, EG;

Rania Wael, Cairo, EG;

Ramy Atawia, Kanata, CA;

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04L 5/0032 (2013.01);
Abstract

The described technology is generally directed towards dynamically adapting the parameter data of an intercell interference avoidance feedback and decision window (e.g., sizing and frequency) to obtain interference-related data from a UE. The interference-related data analyzed from a returned window is used to recommend a decision to a ran node as to which radio resources should be avoided when scheduling UE-related communications to avoid intercell interference. A controller (e.g., RIC) dynamically attempts to optimize the frequency and periodicity of the intercell interference avoidance feedback and decision windows to be transmitted, based on measurements and KPIs from the RAN node, e.g., UE traffic pattern data and QoS requirements, as well as performance capability data of the node. The node can accept the window parameter data or reject the request for reprocessing by the controller.


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