The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Feb. 15, 2022
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventors:
Shinji Saito, Yokohama, JP;
Yoichiro Kurita, Minato, JP;
Rei Hashimoto, Edogawa, JP;
Kei Kaneko, Yokohama, JP;
Takayoshi Fujii, Yokohama, JP;
Assignee:
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/026 (2006.01); A61B 5/145 (2006.01); A61B 5/1455 (2006.01); H01S 5/11 (2021.01); H01S 5/183 (2006.01); H01S 5/34 (2006.01); H01S 5/42 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0262 (2013.01); A61B 5/14532 (2013.01); A61B 5/1455 (2013.01); H01S 5/11 (2021.01); H01S 5/18305 (2013.01); H01S 5/3402 (2013.01); H01S 5/423 (2013.01); A61B 2562/0238 (2013.01);
Abstract
An analysis device includes a substrate including a first surface, and a second surface positioned at a side opposite to the first surface; a light source part located at the first surface of the substrate, the light source part including a quantum cascade laser; a light detector located at the first surface of the substrate; and a wiring part located at the first surface of the substrate, the wiring part being electrically connected with the light source part and the light detector.