The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 19, 2024
Applicants:

Vec Imaging Gmbh & Co. KG, Erlangen, DE;

Varex Imaging Corporation, Salt Lake City, UT (US);

Inventors:

Houman Jafari, Erlangen, DE;

Bo Gao, Morrisville, NC (US);

Vance Scott Robinson, South Jordan, UT (US);

Assignees:

VAREX IMAGING CORPORATION, Salt Lake City, UT (US);

VEC Imaging GmbH & Co. KG, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/14 (2006.01); H01J 35/08 (2006.01); H01J 35/12 (2006.01);
U.S. Cl.
CPC ...
H01J 35/153 (2019.05); H01J 35/112 (2019.05); H01J 35/12 (2013.01); H01J 35/147 (2019.05); H01J 2235/068 (2013.01); H01J 2235/086 (2013.01);
Abstract

Some embodiments include a system, comprising: at least one x-ray source, each x-ray source including: an electron source configured to generate an electron beam; and a target configured to receive the electron beam and convert the electron beam into an x-ray beam; and a collimator. A first edge of the collimator closest to the electron source is closer to the electron source than a central axis of the x-ray beam before entering the collimator; and a second edge of the collimator opposite to the first edge is at the central axis of the x-ray beam before entering the collimator or closer to the electron source than the central axis of the x-ray beam before entering the collimator.


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