The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Aug. 07, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Huiwen Xu, Cupertino, CA (US);

Deepanshu Dutta, Fremont, CA (US);

Ken Oowada, Fujisawa, JP;

Bo Lei, San Ramon, CA (US);

Ravi J. Kumar, Redwood City, CA (US);

Sujjatul Islam, San Jose, CA (US);

Xue Pitner, Sunnyvale, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/14 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 29/14 (2013.01); G11C 2029/1202 (2013.01);
Abstract

An apparatus includes one or more control circuits that are configured to connect to a plurality of nonvolatile memory cells. The one or more control circuits are configured to detect a first boundary between written and unwritten portions of an open block and, in response to detecting the first boundary, check for a second boundary between written and unwritten portions of the open block in order to determine if the open block was subject to a non-uniform erase operation.


Find Patent Forward Citations

Xu, Huiwen. (2026). Aborted operation detection for nonvolatile memory with non-uniform erase (U.S. Patent No. 12620450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12620450

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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