The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jul. 15, 2022
Applicant:

Stryker Corporation, Kalamazoo, MI (US);

Inventors:

Steven Barry Duke, Bothell, WA (US);

Fred W. Chapman, Newcastle, WA (US);

Assignee:

Stryker Corporation, Portage, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 25/87 (2013.01); A61N 1/39 (2006.01); G10L 15/26 (2006.01); G10L 21/055 (2013.01); G16H 10/60 (2018.01);
U.S. Cl.
CPC ...
G10L 25/87 (2013.01); A61N 1/39 (2013.01); A61N 1/3937 (2013.01); G10L 15/26 (2013.01); G10L 21/055 (2013.01); G16H 10/60 (2018.01);
Abstract

Various techniques relate to aligning parameters and audio recordings obtained at a rescue scene. An example method includes receiving, from a first device, a first file including first measurements of a first parameter at first discrete times in a time interval. The first file further indicates a marker output by the first device during the time interval. The method also includes receiving, from a second device, a second file comprising second measurements of a second parameter at second discrete times in the time interval. The method includes detecting the marker output by the first device in the second measurements of the second parameter and based on detecting the signal output by the first device in the second measurements, generating aligned data by time-aligning the first measurements of the first parameter and the second measurements of the second parameter. The method further includes outputting the aligned data.


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