The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Nov. 16, 2020
Siemens Aktiengesellschaft, Munich, DE;
Silvio Becher, Munich, DE;
Felix Buggenthin, Munich, DE;
Johannes Kehrer, Munich, DE;
Ingo Thon, Grasbrunn, DE;
Stefan Hagen Weber, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method for checking samples for defects is provided, in which image data of the samples are recorded and classified into predeterminable defect categories by a defect detection algorithm, and the samples classified into a defect category are represented in a multi-dimensional confusion matrix as a classification result of the defect detection algorithm, characterized in that miniature images which reproduce the image data are assigned according to the classified defect categories of the image data to segments of the confusion matrix which represent the defect categories, and these miniature images are displayed visually, the miniature image is assigned by an interaction with a user or a software robot to a different segment from the assigned segment of the confusion matrix, and is either provided as training image data for the defect detection algorithm or is output as training image data for the defect detection algorithm.